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System and Method for Measuring Distribution of Deformation Using Atomic Force (not leading)

Interferometric absolute and real-time surface curvature sensor insensitive to tilt, translation and vibration Overview Kyung-Suk Kim has developed a device to improve modern microscopes by allowing them to measure deformations in a surface at the resolution of mere atoms. The invention can improve the resolution of an atomic micrograph system...

Published: 8/3/2022 | Inventor(s): Kyung-Suk Kim

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Category(s): Research Tools